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  • -12%Limited
    Brand: 
    Megger LT300-EN-BS Original price was: ₹98,760.00.Current price is: ₹87,291.00.
    • CAT IV 300 V applications
    • High current loop tester
    • Single and three-phase testing
    • 16 Hz to 400 Hz operation
    • Two-wire lead set or mains plug leads
  • -8%Limited
    Brand: 
    Megger RCDT310 Original price was: ₹86,500.00.Current price is: ₹79,664.00.
    • Tests standard, DC, selective and programmable RCDs
    • Ramp testing (RCDT320/330)
    • Auto (Remote) testing (RCDT320/330)
    • Three-phase safe
    • Enables testing on 110 V centre tapped supplies
    • USB interface for downloading test result (RCDT330)
    • Tough rubber armoured case with built-in cover
    • Weatherproof to IP54
  • -8%Limited
    Brand: 
    Megger RCDT320 Original price was: ₹96,500.00.Current price is: ₹88,987.00.
    • Tests standard, DC, selective and programmable RCDs
    • Ramp testing (RCDT320/330)
    • Auto (Remote) testing (RCDT320/330)
    • Three-phase safe
    • Enables testing on 110 V centre tapped supplies
    • USB interface for downloading test result (RCDT330)
    • Tough rubber armoured case with built-in cover
    • Weatherproof to IP54
  • -8%Limited
    Brand: 
    Megger RCDT330 Original price was: ₹108,687.00.Current price is: ₹99,800.00.
    • Tests standard, DC, selective and programmable RCDs
    • Ramp testing (RCDT320/330)
    • Auto (Remote) testing (RCDT320/330)
    • Three-phase safe
    • Enables testing on 110 V centre tapped supplies
    • USB interface for downloading test result (RCDT330)
    • Tough rubber armoured case with built-in cover
    • Weatherproof to IP54
  • -21%Limited
    Brand: 
    MRP-201 Original price was: ₹184,080.00.Current price is: ₹145,000.00.

    Features

    • Testing RCD breakers of AC, A, B types
      • Testing of general, short delay and selective RCDs for the rated current values 10, 15, 30, 100, 300, 500 mA
      • Measurement of IA trip current and tripping time tA for currents 0.5 IΔn, 1 IΔn, 2 IΔn, 5 IΔn
      • RE and UB measurement without RCD tripping
      • Extended AUTO function of RCD measurement
      • Measurement of IA and tA during one RCD tripping
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